Accessing the LVM knowledge database What's ...

Accessing the LVM knowledge database What’s needed, what’s available? LVMC Liverpool, November 2008

Stephen Kyle Honorary senior research fellow, University College London Honorary research fellow, Coventry University [email protected]

LVM activity: end users

micronSpace [email protected] [email protected]

• End user activity is significant but difficult to quantify without some insider knowledge • End users’ need for information and information exchange is demonstrated by events such as: • LVMC: An annual UK event now in 4th. year with strong support from Airbus • CMSC: An annual US event running since the 1980s, very much user driven • Oldenburg: An annual German event run since 2002 by the Technical University of Oldenburg • Boeing: Now no longer running but the annual Boeing LargeScale Optical Metrology Seminar had significant attendance (last event in 2001) LVMC Liverpool, November 2008

LVM activity: systems manufacturers

micronSpace [email protected] [email protected]

• LVM systems manufacturers demonstrate growth, for example: • Metris, originally a scanner technology company has acquired: • • • •

Krypton – robot measurement technology 3D Scanners - source of new robot CMM arm MetricVision – large volume, very high accuracy 3D laser radar ArcSecond – indoor GPS

• Hexagon, originally a diverse engineering company has acquired: • • •

A range of CMM manufacturers (Brown and Sharpe, Tesa, CE Johansson, etc) Romer (US and France) – articulated CMM arms Leica Geosystems - metrology and surveying technologies

• Faro, originally a CMM arm manufacturer, has acquired: • • •

SMX – laser tracker manufacturer iQvolution – large volume 3D laser scanner Dimensional Photonics fringe projection technology LVMC Liverpool, November 2008

Plenty of action and nothing to learn?

micronSpace [email protected] [email protected]

• Buy system, point and press, get red light/green light • Is it that simple or is a greater understanding required? • Some areas where in-depth knowledge might be needed: • Choosing the best instruments and techniques for a given task • Confirming traceability to re-assure clients • Realistic error budgeting to achieve required accuracies • Designing an optimal measurement strategy with multiinstrument setups • Performance checking to prove a chosen system does what it says on the box • Working out what went wrong (yes, it does happen) LVMC Liverpool, November 2008

Problem: handling variable uncertainties

micronSpace [email protected] [email protected]

From ArcSecond white paper 2002 Theodolite intersection uncertainties

Metris iGPS (formerly ArcSecond iGPS) LVMC Liverpool, November 2008

Needs: Understanding large scale metrology

micronSpace [email protected] [email protected]

• 2001: A 12 month, DTI-sponsored project to help users understand large scale metrology, with emphasis on laser tracker technology • Run by University College London (lead partner) and NPL, with support from Leica Geosystems • Project results: • User survey • Best practice guide • Mathematical model • Internet calculator

LVMC Liverpool, November 2008

What LVM knowledge is available?

micronSpace [email protected] [email protected]

• A comprehensive range of consistent material is not available • Structured courses and guided learning are not available • Conferences offer good information exchange but are not instructional • A disparate range of material is potentially available as the next slides show

LVMC Liverpool, November 2008

Basic metrology

micronSpace [email protected] [email protected]

LVMC Liverpool, November 2008

Introductory material

• • •

micronSpace [email protected] [email protected]

Axyz Dictionary of 3D Metrology: uses the format of a Windows help file (above) Full LVM systems overview: PowerPoint file from Oldenburg 2005 (updated to end 2007) Wiley’s Handbook of Measuring System Design: Article 194 Large scale metrology (from UCL) LVMC Liverpool, November 2008

UCL metrology lecture course archive/1

micronSpace [email protected] [email protected]

Introductory material on day 1: • Background and older metrology methods • LVM systems overview • New developments in LVM • Example R&D: AIRBUS automated wingbox assembly LVMC Liverpool, November 2008

UCL metrology lecture course archive/2

micronSpace [email protected] [email protected]

Introductory material on day 2: • Rotations • Coordinate systems and transformation • Orientation (instrument/instrument//object) • Calibration and instrument modelling >> further lectures day 3,4 .. LVMC Liverpool, November 2008

Web tutorials

micronSpace [email protected] [email protected]

Find out about: • CMMs from Brown & Sharpe • Photogrammetry from GSI • Optical tooling from Brunson LVMC Liverpool, November 2008

micronSpace

Books: Mathematics

Lots of relevant material in books on surveying, geodesy and photogrammetry. Examples here by Kraus, Mikhail.

[email protected] [email protected]

Mathematics for Users in Leica’s Axyz documentation

LVMC Liverpool, November 2008

Books: Close range photogrammetry

micronSpace [email protected] [email protected]

Close range photogrammetry by Luhmann, Robson, Kyle and Harley, Whittles Publishing, 2006.

LVMC Liverpool, November 2008

Books: Applications of 3D .. from images

micronSpace [email protected] [email protected]

Applications of 3D measurement from images by Freyer, Mitchell and Chandler, Whittles Publishing, 2006.

LVMC Liverpool, November 2008

Books: Handbuch Ingenieurgeodäsie

micronSpace [email protected] [email protected]

Handbuch Ingenieurgeodäsie, Maschinen- und Anlagenbau by Löffler, Wichman Verlag, 2002. Handbook of engineering geodesy, mechanical and production plant engineering

LVMC Liverpool, November 2008

Books: Vermessungsverfahren

micronSpace [email protected] [email protected]

Vermessungsverfahren im Maschinen- und Anlagenbau by Schwarz, Verlag Konrad Wittwer, 1995 Surveying methods in mechanical and production plant engineering

LVMC Liverpool, November 2008

micronSpace

Books: Optical tooling

[email protected] [email protected]

Old but invaluable •

1962: “Optical Tooling ..” by Philip Kissam is a good source of material on optical tooling. No longer in print.

•

1967: “Optical Alignment” by Dagnall and Pearn is an excellent reference source of methods from Rank Taylor Hobson.

LVMC Liverpool, November 2008

Standards and best practice

micronSpace [email protected] [email protected]

•

ASME B89.4.19-2006 American Society of Mechanical Engineers: Evaluation of Laser Based Spherical Coordinate Measurement Systems, released Jan. 2007.

•

ASME B89.4.22-2004 American Society of Mechanical Engineers: Methods for Performance Evaluation of Articulated Arm Coordinate Measuring Machines.

•

VDI/VDE 2634 (2002) Verein Deutscher Ingenieure: standard for evaluating (photogrammetric) triangulation systems (section 1) and surface scanning systems (section 2).

•

Best Practice Guide No. 6 “Uncertainty evaluation” (2006) M. G. Cox, P. M. Harris, National Physical Laboratory (see also others on slide 8)

•

NMSPU Best Practice Guide, Large Scale Metrology (2001) UCL/NPL project results are available from UCL and include: • • • •

Best practice guide Mathematical model Mathematical example Network design tool LVMC Liverpool, November 2008

Proposals for what’s needed

micronSpace [email protected] [email protected]

•

Training and further education courses at engineer and executive level • Possibly build on NPL training courses currently developed for technicians and operators

•

Public website • Provide introductory material and pointers to further material, courses, conferences

•

Company intranets: An electronic library of structured core material which could include: • Basic dimensional metrology and measurement uncertainty • Standards and performance measurement • Mathematics and algorithms for LVM • How things work (trackers, scanners, ..) • Calibration and instrument modelling

•

Company intranets: Tailored material which could include: • Applications database with worked examples • Internal best practice and quality assurance • Technology watch – annual review of patents, publications, products, etc. LVMC Liverpool, November 2008

Contact points for further discussion

micronSpace [email protected] [email protected]

•

Dr. Stephen Kyle: [email protected] Honorary Senior Research Fellow, University College London

•

Prof. Stuart Robson: [email protected] Professor of Photogrammetry and Laser Scanning, University College London

•

Trevor Toman: [email protected] Specialist Business Manager, West Midlands Manufacturing Measurement Centre

•

Keith Bevan: [email protected] Training Product Development Manager, National Physical Laboratory

LVMC Liverpool, November 2008