Home
Add Document
Sign In
Create An Account
Damage correlations in semiconductors exposed to ... - HPCwww
Recommend Documents
No documents
Damage correlations in semiconductors exposed to ... - HPCwww
Download PDF
84 downloads
0 Views
684KB Size
Report
Comment
Abstract. The use of nonionizing energy loss (NIEL) in predicting the effect of gamma, electron and
proton
irradiations on Si, GaAs and InP devices is discussed.
×
Report "Damage correlations in semiconductors exposed to ... - HPCwww"
Your name
Email
Reason
-Select Reason-
Pornographic
Defamatory
Illegal/Unlawful
Spam
Other Terms Of Service Violation
File a copyright complaint
Description
×
Sign In
Email
Password
Remember me
Forgot password?
Sign In
Our partners will collect data and use cookies for ad personalization and measurement.
Learn how we and our ad partner Google, collect and use data
.
Agree & close