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Erratum: ``Double-layer'' method to improve image quality of industria SPECT
This content has been downloaded from IOPscience. Please scroll down to see the full text. 2012 JINST 7 E01001 (http://iopscience.iop.org/1748-0221/7/01/E01001) View the table of contents for this issue, or go to the journal homepage for more
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P UBLISHED BY IOP P UBLISHING FOR SISSA R ECEIVED: December 17, 2011 ACCEPTED: December 19, 2011 P UBLISHED: January 10, 2012
Erratum: “Double-layer” method to improve image quality of industria SPECT
a Department
of Nuclear Engineering, Hanyang University, 17 Haengdang, Seongdong, Seoul 133-791, Korea b Korea Atomic Energy Research Institute, 150-1, Dukjin, Yuseong, Daejon 305-353, Korea
E-mail:
[email protected] E RRATUM TO : 2011 JINST 6 C12032 K EYWORDS : Inspection with gamma rays; Detection of defects The authors would like to correct the title into: “Double-layer” method to improve image quality of industrial SPECT (the letter “l” is missing from “industrial”) Also, they would like to rectify the authors order into: J.G. Park, C.H. Kim, H. Seo, Y.S. Kim, S.H. Jung, J.B. Kim and J. Moon
1 Corresponding
author.
c 2012 IOP Publishing Ltd and SISSA
doi:10.1088/1748-0221/7/01/E01001
2012 JINST 7 E01001
J.G. Park,a,b H. Seo,a C.H. Kim,a,1 S.H. Jung,b J.B. Kim,b J. Moonb and Y.S. Kima
