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A Novel Image Steganography (NIS) Technique. Amanpreet Kaur. 1. , Neetu Sardana. 2. 1 Department of CS/IT. JIIT, Noida, UP, India [email protected].
This paper describes the methods used to establish AC voltage traceability of electrical department at National Institute for Standard (NIS), Egypt related to ...
Establishment of AC Voltage Traceability at NIS, Egypt
Espoo, Finland
NPL
Mamdouh Halawa Department of Electrical Metrology, National Institute for Standards (NIS), Egypt
June 2007
Abstract: This paper describes the methods used to establish AC voltage traceability of electrical department at National Institute for Standard (NIS), Egypt related to National Institute for Standard and Technology (NIST), US. The methods include achieving the traceability by using thermal voltage converters (TVCs) and micropotentiometers (µPots). For the AC-DC Difference traceability, the reliability of the new automated calibration system of NIS was confirmed through formed bilateral intercomparison. This comparison was organized through a set of (TVC’s) to cover the range from 1 V to 200 V at frequencies of 55 Hz, 1 kHz, 10 kHz and 200 kHz. The comparison results include the uncertainty analysis, the visual-bar schemes and the proficiency testing. New three µPots were also fabricated at NIST to establish the traceability in low ac voltage source from 10 mV to 5 V at frequencies from 20 Hz to 1 MHz. The characterization of these converters was performed using the LTSpice electrical simulation software. This work includes also the determination of some specific parameters for the thermoelements (TEs) of this converters.
vi. Uncertainty Budget
1. AC Voltage Measurements
Source of Uncertainty
i. TVC Sets • Ballantine
• NIS Fabricated
iii. Frequencies • From 20 Hz • To 1 MHz
Tee Connector
Rectangular (Type B)
Room Temp. Change
Rectangular (Type B)
Repeatability (20 times)
Normal (Type A)
Combined Standard
Normal
Expanded Uncertainty
Normal (k = 2)
( For 1 V at 20 kHz)
ii. Ranges • From 0.5 V
• Holt
Calibration Certificate
Probability Distribution Normal (Type B)
• To 1000 V
2. AC Current Measurements
Contribution ppm
4 0.7 0.2 1.5 4.4 9
No.
Test Voltage
Test freq.
1
1V
2
NIST Results, ppm
NIS Results, ppm
AC-DC Difference
Expanded Uncert. ±
AC-DC Difference
Expanded Uncertainty, ±
55 Hz
0.4
4
-6.6
6
1V
1 kHz
1.6
3
-11.7
8
3
1V
10 kHz
0.8
3
2.7
7
4
1V
20 kHz
-1.2
3
-5.4
9
5
3V
55 Hz
6.5
4
3.8
8
6
3V
1 kHz
4.9
3
-3.5
6
7
3V
10 kHz
4.5
3
-2
7
8
3V
20 kHz
3.9
3
-4.5
6
9
10 V
55 Hz
-5.8
4
2.6
7
10
10 V
1 kHz
-5.7
3
2.8
8
11
10 V
10 kHz
-4.4
3
0.7
7
12
10 V
20 kHz
-2.6
3
2
6
13
100 V
55 Hz
-1.3
4
3.4
7
14
100 V
1 kHz
0
4
-2
5
15
100 V
10 kHz
0.4
4
-1
6
16
100 V
20 kHz
-0.5
4
-1
8
17
200 V
55 Hz
-0.9
4
-0.5
10
18
200 V
1 kHz
-1
4
-5
8
19
200 V
10 kHz
-7.3
1
6
7
20
200 V
20 kHz
-12.7
1
-0.4
6
Around 10 ppm K=2
v. Automated System
200 V at 1 kHz
AC-DC Differrence Limits
0 -2
1
3
-1
2
-4 -5
-6
-5
-8 -10 -12 -14
4
Around 15 ppm (K= 2)
3. AC Voltage Sourcing (Micro-pots) i.M-Pots Sets ii. Ranges iii. Freq. • NIS-Fabricated “7 Units”
• From 10 mV
• From 20 Hz
• To 5 V
• To 1 MHz
iv. Uncertainty Under preparing related to NIST bi-lateral comparison
4. Electrical Simulation of the Thermal Converters Practical
Simulation
0
Eq. Ct. of TVC
0 1
2
-2
-2
-4
Eq. Ct. Micro-pot
Comparison between practical and simulated results
-4
-6 NIST
NIS
10 V at 20 kHz
4.4
8
2 0.4
0 1
-0.6 2
-3.6
-6
-6.6
-8 -10 -12
-12.6 NIST
NIS
AC-DC Differrence Limits
AC-DC Differrence Limits
• To 1 MHz
10
4
-14
• To 20 A
3
1 V at 55 Hz
-4
• Holt Current Shunt
4
2
-8
NIS
6
-2
• From 20 Hz
-7
-13 NIST
• From 5 mA
100 V at 1 kHz
3
2
iii. Freq.
6
AC-DC Differrence Limits
4
ii. Ranges
• Fluke Current Shunt
iv. Uncertainty
viii. Samples of Comparison Results
iv. Uncertainty
i.TCC Sets
8
6 4 2
2 0.4
0 -2
1
-2.6
2
-4 -6 -8
-4 -5.6 NIST
NIS
Our Guest for 2006 ”Joseph Kinard” NIST
Our Guest for 2007 ”Torsten Funck” PTB
Invited Guest for 2008 “Ralf Behr” PTB
Conclusion: At the end of 2006, the establishment of traceability of NIS capabilities in the AC voltage was completed according to NIST standards. The NIS automated calibration system, the new TVCs and the new fabricated micropotentiometers of NIS were confirmed, to achieve this traceability, through a comparison between NIST, US and NIS, Egypt. The thermal converters of NIS were firstly characterized by using a powerful electrical simulation program to investigate an appropriate equivalent electrical circuit and to determine the characteristic parameters of the thermoelements at the rated current. The reliability of the new automated calibration system of NIS associated with the good performance of the new fabricated devices reduce the uncertainty of this type of measurements
Acknowledgment: The author is thankful to Joseph R. Kinard and Thomas Lipe, Electricity Division, National Institute of Standards and Technology (NIST), Gaithersburg, USA for their encouragements and valuable advices to support this work. Many thanks also for Mark Parker and Andrew Koffman from NIST for their gracious hospitality during the time of fabrication. Their valued suggestions as well as their exerted efforts promoted this work so much.
