Home
Add Document
Sign In
Create An Account
Secondary ion mass spectrometry depth profiling of nanometer-scalep ...
Recommend Documents
No documents
Secondary ion mass spectrometry depth profiling of nanometer-scalep ...
Download PDF
7 downloads
43 Views
345KB Size
Report
Comment
SIMS
depth profiling of nanometer-scale p*-n junctions 334. 10""2 I 'rrrr -| '1 'rr107. - 6keV/lElScm2 FIB Ga+ -â> Si.
3
21 is 1° Concentration m 63 ____ _- m.
×
Report "Secondary ion mass spectrometry depth profiling of nanometer-scalep ..."
Your name
Email
Reason
-Select Reason-
Pornographic
Defamatory
Illegal/Unlawful
Spam
Other Terms Of Service Violation
File a copyright complaint
Description
×
Sign In
Email
Password
Remember me
Forgot password?
Sign In
Our partners will collect data and use cookies for ad personalization and measurement.
Learn how we and our ad partner Google, collect and use data
.
Agree & close
