Nov 10, 2010 - power supply (SOLO/AXIS-180 Pulsed DC Plasma Generator, ..... tantalum sputtered coatings on steel by using Eddy currents,â IEEE Trans.
Available online 26 August 2016. The aim of this paper is to investigate the effects of the substrate bias on the structure and properties of the TiCN thin films.
Mariacristina Pivaa, Enrico Santarellib, c, d, Marco Vivarellia, c, e, f, â a Catholic University, Department of Economic and Social Sciences, Via Emilia Parmense ...
45, No. 9 COMMUNICATIONS OF THE ACM. Your refrigerator starts making unusual noises; you figure it is ... The first 50 URLs retrieved by each of these engines were collected. ... brand names in the refrigerator example signifies bias in the results o
retrieved a URL containing the name Amana. ... about differences between search engine results, other .... everything after the top-level domain name is elimi-.
Dec 20, 2010 - Chia-Han Lai, Su-Jien Lin, Jien-Wei Yeh and Andrew Davison. Department of Materials Science and Engineering, National Tsing Hua ...
The BIAS Map: Behaviors from Intergroup Affect and Stereotypes .... Asians; Fiske et al., 2002; Lin et al., 2005; e.g., Jews; Fiske et al., 2002; Glick, 2002, 2005) â.
Sep 18, 2018 - Meanwhile, the CrN film with gradient bias design could bear a load of 25 N .... The surface roughness (Ra) is investigated by Alpha-Step IQ ...
Jan 18, 2017 - degree local polynomial regression, we show that, as with point estimation, coverage error adapts .... co
Jan 18, 2017 - The pivotal work was done by Hall (1992b), and has been relied upon since. ... error optimal bandwidths a
Feb 11, 2011 - Keywords: TiN film; Arc spraying; Substrate voltage bias; Formation stages; Structure and ..... 6) Continuous polycrystalline film formation stage.
coupling capacitor and/or by using the insulated tip, the perturbation of plasma can be ..... tantalum disk, a large stray capacitance is assumed for the probe.
Apr 21, 2006 - CoCrPt and CoCrPt-SiO2 magnetic layers were investigated as a function of substrate bias. It was found that the use of substrate bias greatly ...
Feb 15, 2008 - arXiv:0801.4826v2 [astro-ph] 15 Feb 2008. Draft version February 15, 2008. Preprint typeset using LATEX style emulateapj v. 10/09/06.
The Effect of Surprise on Hindsight Bias Depends on the Hindsight Component. Steffen Nestler and Boris Egloff. University of Leipzig. Two diverging hypotheses ...
Abstract. We investigated AC bias stress instability of indium-gallium-zinc- oxide (IGZO) Thin-film transistors (TFTs). AC bias frequency dependence showed ...
This is also a form of bias, but can be alternatively termed issue bias to capture ... to only highlight those pieces of evidence which support a desired outcome.
The Effect of Pulse DC and DC Substrate Bias during In Situ Cleaning. PVD Process on Surface Roughness. Hanizam ª,* , H. Soufhwee, A.Ra, K.Anuar, A.Ra, ...
INELASTICALLY SCATTERED. BSEs: ⢠sensitivity on atom density within a specimen. ⢠material (i.e. âZâ) contrast. EXTREMELY LOW TAKE-OFF. ANGLE BSEs:.
Department of Computer Science. University of California, Santa Cruz ...... its bias for single good features and discri
Biased About Biases: The "Theory of the Handicapped Mind" in the Psychology
of Intelligence Analysis. Robert R. Hoffman. IHMC. Presented at the 2004 ...
Oct 9, 2013 - halo bias using real space measurements. Aseem Paranjape1,2â, Emiliano Sefusatti2,3, Kwan Chuen Chan4, Vincent. Desjacques4, Pierluigi ...
inactive, and all other customers are categorized as active. ..... A measure of the time and space resources used when estimating the .... each model in a task environment detailing German cities with a ..... Forecasting elections, sporting events, .
Mar 13, 2016 - This content has been downloaded from IOPscience. Please scroll down to see the full text. Download details: IP Address: 78.128.176.124.
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The Effect of Mesh Bias and Substrate Bias on the Properties of a-Si:H Deposited by Triode Plasma Chemical Vapour Deposition
This content has been downloaded from IOPscience. Please scroll down to see the full text. 1994 Jpn. J. Appl. Phys. 33 5663 (http://iopscience.iop.org/1347-4065/33/10R/5663) View the table of contents for this issue, or go to the journal homepage for more
Download details: IP Address: 78.128.176.124 This content was downloaded on 13/03/2016 at 23:15
