Lecture 1: Reliability of Nanoelectronic Devices ... Technology & transistors in
electronics. 4. 1906- ... Electronics is a vibrant industry with many new
applications.
NCN
www.nanohub.org
ECE695: Reliability Physics of Nano-Transistors Lecture 1: Reliability of Nanoelectronic Devices Muhammad Ashraful Alam
[email protected]
Alam ECE 695
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copyright 2013 This material is copyrighted by M. Alam under the following Creative Commons license:
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Alam ECE 695
Outline of lecture 1 1. Evolving Landscape of Electronics 2. Performance,Variability, and Reliability 3. Classification of Reliability 4. Course Information 5. Conclusions
Alam ECE 695
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Technology & transistors in electronics Vacuum Tubes
Bipolar
MOSFET
Now ?? Sub-60 mV/dec Switches Bio Sensors Displays ….
Temp
1906-1950s
1900
1947-1980s
Bipolar
Tubes 1920
1960-until now
1940
1960
MOS 1980
2000
? 2020 4
Poly-Si
Carbon NanoNet
super-capacitors
Solar cells
low
medium
high
Performance
Landscape of electronics in evolving
Small
Medium
Large
Area Electronics is a vibrant industry with many new applications Alam ECE 695
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Evolution in microelectronics Mobility improvement by new materials (Ion)
Electrostatics improvement by new device geometry (Ion/Ioff) SOI
TI
Strained silicon Ge channel III-V materials
FINFET
NW
IBM
Silicon on insulator (SOI) Tri-gate (e.g. FINFET) Surround gate (e.g. NW) Alam ECE 695
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Evolution in large area electronics Flexible Electronics
Organic Solar Cells
New materials for novel devices enhance performance, but also accentuate reliability concerns Alam ECE 695
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Outline 1. Landscape of Electronics: Performance 2. Performance,Variability, and Reliability 3. Classification of Reliability 4. Course Information 5. Conclusions
Alam ECE 695
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Uniformity of Components in Systems Maudslay (1800), Whitworth (1841), Sellers (1864)
Building large systems presumes uniformity of components …. Alam ECE 695
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Process, reliability, and design Reliability
Process
plus
t=0
-15%
-10%
-5%
ID,nom
ID +15%
Design We do not have too much margin Alam ECE 695
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Process variations in scaled A. Asenov, TED03 Dev 1 Dev 2 1) Line Edge Roughness transistors Leff1