ECE695: Reliability Physics of Nano-Transistors Lecture ... - nanoHUB

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Lecture 1: Reliability of Nanoelectronic Devices ... Technology & transistors in electronics. 4. 1906- ... Electronics is a vibrant industry with many new applications.
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ECE695: Reliability Physics of Nano-Transistors Lecture 1: Reliability of Nanoelectronic Devices Muhammad Ashraful Alam [email protected]

Alam ECE 695

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copyright 2013 This material is copyrighted by M. Alam under the following Creative Commons license:

Conditions for using these materials is described at http://creativecommons.org/licenses/by-nc-sa/2.5/ 2

Alam ECE 695

Outline of lecture 1 1. Evolving Landscape of Electronics 2. Performance,Variability, and Reliability 3. Classification of Reliability 4. Course Information 5. Conclusions

Alam ECE 695

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Technology & transistors in electronics Vacuum Tubes

Bipolar

MOSFET

Now ?? Sub-60 mV/dec Switches Bio Sensors Displays ….

Temp

1906-1950s

1900

1947-1980s

Bipolar

Tubes 1920

1960-until now

1940

1960

MOS 1980

2000

? 2020 4

Poly-Si

Carbon NanoNet

super-capacitors

Solar cells

low

medium

high

Performance

Landscape of electronics in evolving

Small

Medium

Large

Area Electronics is a vibrant industry with many new applications Alam ECE 695

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Evolution in microelectronics Mobility improvement by new materials (Ion)

Electrostatics improvement by new device geometry (Ion/Ioff) SOI

TI

Strained silicon Ge channel III-V materials

FINFET

NW

IBM

Silicon on insulator (SOI) Tri-gate (e.g. FINFET) Surround gate (e.g. NW) Alam ECE 695

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Evolution in large area electronics Flexible Electronics

Organic Solar Cells

New materials for novel devices enhance performance, but also accentuate reliability concerns Alam ECE 695

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Outline 1. Landscape of Electronics: Performance 2. Performance,Variability, and Reliability 3. Classification of Reliability 4. Course Information 5. Conclusions

Alam ECE 695

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Uniformity of Components in Systems Maudslay (1800), Whitworth (1841), Sellers (1864)

Building large systems presumes uniformity of components …. Alam ECE 695

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Process, reliability, and design Reliability

Process

plus

t=0

-15%

-10%

-5%

ID,nom

ID +15%

Design We do not have too much margin Alam ECE 695

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Process variations in scaled A. Asenov, TED03 Dev 1 Dev 2 1) Line Edge Roughness transistors Leff1