Guest Editorial: Special Issue on the 2013 IEEE ... - IEEE Xplore

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aspects of theories and practice of measurement science and technology ... to the hard work of many dedicated associate editors and ... Ph.D. degree in electronics engineering from the University of Padua, Padua, Italy, in 1986 ... Department of Information Engineering and Computer Science, University of Trento, Trento,.
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 63, NO. 5, MAY 2014

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Guest Editorial: Special Issue on the 2013 IEEE International Instrumentation and Measurement Technology Conference Minneapolis, MN, USA, May 6–9, 2013

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HE 30th annual IEEE International Instrumentation and Measurement Technology Conference (I2 MTC) was held in Minneapolis, MN, on May 6–9, 2013. It is the largest city in the U.S. state of Minnesota, and the 48th largest city in the United States with an estimated population of about 400 000 people. The University of Minnesota, Twin Cities, located in Minneapolis and St. Paul, has the sixth largest main campus student body in the United States, with more than 50 000 students. The conference was attended by a total of 434 registered participants, including 97 postgraduate students and five undergraduate students. The technical program consisted of a series of scientific and technical sessions, covering all aspects of theories and practice of measurement science and technology, instrumentation, and a wide range of applications, as reflected also in the diversity of the papers. Following the usual review process, a total of 365 papers from all over the world were accepted, and were organized into 205 oral session presentations and 160 poster session presentations. The oral presentation sessions included three invited keynotes and seven special sessions, which were closely aligned with the I2 MTC 2013 conference theme Instrumentation and Measurement for Life. In particular, the special sessions attracted an overwhelming response from the community and were well attended at the conference. The topics of special sessions were as follows: 1) Emerging Methods for Measuring, Modeling and Instrumentation in Medical Applications; 2) Microwave, Millimeter Wave, and Terahertz: Devices, Methods, Applications, and Measurements; 3) Wireless Sensors Networks for Assisted Living; 4) RF/Microwave Materials Characterization; 5) Instrumentation and Measurement for Improving Quality, Reliability and Safety; and 6) Advanced Measurement and Data Processing for Engineering System Health Monitoring. In addition, a special session on Technology Transfer and Expert Panel Discussion was organized with great success. The proposed tracks also offered the opportunity

for professionals and representatives from companies to share their experiences and practical advanced knowledge. Following the I2 MTC 2013, a total of 102 papers that were technically extended in a substantial way from their conference proceeding versions were submitted to this special issue. Due to the hard work of many dedicated associate editors and reviewers, who are doing this job on a voluntary basis, we are able to present to you today this high-quality special issue. It contains 41 accepted papers that not only represent the latest developments in the field of instrumentation and measurement, but also offer possible solutions to existing problems. We hope that the content of this special issue provides a good reference point for the researchers and practitioners, who are active in the field and will serve as a catalyst to trigger further investigations, offering solutions to existing and emerging measurement problems. It has been our great pleasure to be the Guest Editors of this special issue. We owe sincere thanks to many people without which it would be impossible to have this special issue published. First of all, we would like to thank the authors for their excellent contributions and dedication. We are also grateful to all the Associate Editors and Reviewers, who devoted their time and effort, on a voluntary basis and on a short time scale to ensure that all submissions were rigorously reviewed. A special thanks goes to the Editor-inChief of the IEEE T RANSACTIONS ON I NSTRUMENTATION AND M EASUREMENT , Prof. Alessandro Ferrero, for inviting us to serve as the Guest Editors and for his support. Thank you, Cam Ingelin and Reta Wehmeier, for giving us timely advice and help.

DARIO P ETRI, Guest Editor S ERGEY K HARKOVSKY, Guest Editor

Digital Object Identifier 10.1109/TIM.2014.2311906 0018-9456 © 2014 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.

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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 63, NO. 5, MAY 2014

Dario Petri (M’92–SM’05–F’09) received the M.Sc. (summa cum laude) degree and the Ph.D. degree in electronics engineering from the University of Padua, Padua, Italy, in 1986 and 1990, respectively. He was an Assistant Professor with the Department of Electronics and Information Engineering, University of Padua, from 1990 to 1992. In 1992, he joined the University of Perugia, Perugia, Italy, as an Associate Professor, where he became a Full Professor of measurement and electronic instrumentation in 1999. In 2002, he joined the Department of Information Engineering and Computer Science, University of Trento, Trento, Italy, where he was the Head of the Department from 2010 to 2012. He is currently with the Department of Industrial Engineering. He has authored about 250 papers published in international journals or in proceedings of peer-reviewed international conferences. His current research interests include data acquisition systems design and testing, embedded systems design and characterization, fundamentals of measurement theory, and application of digital signal processing to measurement problems. Dr. Petri chaired the Italy Chapter of the IEEE Instrumentation and Measurement (I&M) Society from 2006 to 2010, and was the Vice President for Conferences of the IEEE I&M Society from 2012 to 2014. He is currently the Chair of the IEEE Italy Section and the Vice President for Finance of the IEEE I&M Society.

Sergey Kharkovsky (M’01–SM’03–F’11) received the Diploma degree in electronics engineering from Kharkov National University of Radioelectronics, Kharkov, Ukraine, and the Ph.D. and D.Sc. degrees in radiophysics from the Kharkov National University, Kharkov, and the Institute of Radio-Physics and Electronics, National Academy of Sciences of Ukraine (IRE NASU), Kharkov, in 1975, 1985, and 1994, respectively. He is currently an Associate Professor of sensor technologies with the Institute for Infrastructure Engineering, University of Western Sydney (UWS), Sydney, NSW, Australia. He was a member of the Research Staff at IRE NASU from 1975 to 1998, a Professor of Electrical and Electronics Engineering with the Cukurova University, Adana, Turkey, from 1998 to 2003, and a Research Associate Professor with the Applied Microwave Nondestructive Laboratory, Electrical and Computer Engineering Department, Missouri University of Science and Technology, Rolla, MO, USA, from 2003 to 2011. He has four U.S. patents to his credit. His current research interests include microwave and millimeter-wave physics and engineering, material characterization, nondestructive evaluation and imaging of composite materials, and structural health monitoring. Dr. Kharkovsky is the Associate-Editor-in-Chief for the IEEE T RANSACTIONS ON I NSTRUMENTATION AND M EASURE MENT (IEEE TIM). He served as the Co-Chair of the Technical Program Committee of the 2013 International Instrumentation and Measurement Technology Conference (I2MTC). He was recognized as an IEEE TIM Outstanding Associate Editor from 2010 to 2012, and he is a recipient of the 2013 H. A. Wheeler Prize Paper Award of the IEEE Antennas and Propagation Society.