Hardened Flip-Flop Optimized for Subthreshold Operation ... - MDPI

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May 24, 2012 - Author to whom correspondence should be addressed; E-Mail: [email protected] ... subthreshold [3] or have modeled the impact of soft errors for ...
J. Low Power Electron. Appl. 2012, 2, 168-179; doi:10.3390/jlpea2020168 OPEN ACCESS

Journal of Low Power Electronics and Applications ISSN 2079-9268 www.mdpi.com/journal/jlpea/ Article

Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation Ameet Chavan 1, Praveen Palakurthi 1, Eric MacDonald 1,*, Joseph Neff 2 and Eric Bozeman 2 1

2

University of Texas at El Paso, Electrical and Computer Engineering, El Paso, TX 79968, USA; E-Mails: [email protected] (A.C); [email protected] (P.P.) SPAWAR System Center, Navy, San Diego, CA 92152, USA; E-Mails: [email protected] (J.N.); [email protected] (E.B.)

* Author to whom correspondence should be addressed; E-Mail: [email protected]; Tel.: +915-747-6959; Fax: +915-747-7871. Received: 7 March 2012; in revised form: 7 May 2012 / Accepted: 8 May 2012 / Published: 24 May 2012

Abstract: A novel Single Event Upset (SEU) tolerant flip-flop design is proposed, which is well suited for very-low power electronics that operate in subthreshold (

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