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... OF WINDSOR. A Delay Generation Technique for. Narrow Time Interval Measurement. By: Rashid Rashidzadeh. University of Windsor. Mar. 14, 2008. 1 ...
RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

A Delay Generation Technique for Narrow Time Interval Measurement

By: Rashid Rashidzadeh University of Windsor

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Why Narrow Time Interval Measurement ?

1. Laser-based distance measurement 2. Rise/Fall time 3 Clock skew degradation measurement in digital circuits 3. 4. Jitter or phase noise measurement (variation of rising and falling edges of digital signals)

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Possible Measurement Methods

Off Chi M Off-Chip Measurementt • Test channel loading g effect • Significant loss and distortion • Large number of parameters or nodes to be monitored On-Chip Measurement • The timing quantities to be measured are on the g as the resolution of the same magnitude measurement device Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Proposed p Measurement Methods in the Literature Increasing the effective measurement resolution through: Subsampling or pulse stretching methods

((a)) A delay line without a reference f oscillator (b) An interpolator with a reference oscillator ((c)) Two delayy lines used as a Vernier delayy line or ring oscillators (d) Time Amplifier

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Time to Digital Conversion Using a Delay Line Stop

D Q

D Q

Tin D

Start

τ

τ

τ

Q

B i Ti Basic Time to Di Digital i lC Converter (TDC)

T in

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

TDC Using a Reference Oscillator C o u n te r

Φ

R e f.

Φ

0

Φ

1

D

D C

9

D C

C

S ta rt D

D

D C

C

C

S to p

T ref Ref. C Counter t

0

Start

2

3

Tin = N ref ×Tref + ( N Start − N Stop )ε

T in

Stop D l Li Delay Line

1

0 2 4 6 8 0 2 4 6 8 0 2 4 6 8 0 2 4 6 8 0 2 4 6 8 0

N start

ε

N stop Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Timing Diagram of TDC with Two Reference Oscillators TB 0

1

2

3

CLK B

TA

0

1

2

CLK A

Start Stop

T in

Tin = N 1 × T A + N 2 × (T A − T B ) Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

An Alternative Method of Short Time Interval Measurement

Vin 1 Δt

Vout 1 N ×Δt

Time Amplifier

Vin 2

Vout 2

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

CMOS Implementation of Time Amplifier

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Charge Pump Delay Locked Loop (DLL) Vin

Phase Frequency Detector

Charge Pump

Vout Voltage Controlled Delay Line

ΔΦ

T Vin Vout

T

In the Locked Condition

Before the Phase Lock is acquired Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

DLL Architecture with Two Distinct Inputs Vin1 Vin

Phase Frequency Detector

Phase Frequency Detector

Charge Pump

Charge Pump

Vout

Vin 2

Vout Voltage Controlled Delay Line

Voltage Controlled Delay Line

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Block Diagram of the Proposed Time Amplifier Phase Frequency Detector

B

Charge Pump

A Vin1

Δ

Vout1

D0

D1

C0

C1

D2

t

C2

ΦA = ΦB

N ×Δt

C3 Vout2

Vin2

At the Locked state

D3

Φ in1 +

TD 0 T × 2π = Φ in 2 + C 0 × 2π T T

Φ in1 − Φ in 2 =

Mar. 14, 2008

2π × (TC 0 − TD 0 ) T 12

RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Two Delay Lines with Selectable Outputs

D0

D1

DN

D2

Vin2

Δt

Vout 1

MUX1 Address

Vout 2

MUX2 Vin1

C0

C1

C2

Mar. 14, 2008

N ×Δt

CN

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Schematic Diagram of the Employed TDC

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

Layout of the Proposed Time Measurement System 854 µm

TDC 733 µm

Time Amp.

Control

Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY OF WINDSOR

0.8 8

1.6

2.4

Non-linear region

3.2 3

Linear region

Saturation region g

0

Output tim me interva al (ns)

4.0 0

Transfer Characteristic of the Time Amplifier

0

80

160

240

320

400

480

Input time interval (ps) Mar. 14, 2008

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RESEARCH CENTRE FOR INTEGRATED MICROSYSTEMS - UNIVERSITY (a) OF WINDSOR

Effect of process variations on Measurement Results Slow-Slow

10 8 6 4 0

2

1.6

2.4

Sta andard deviation (ps)

12

3.2

Fast-Fast

0.8 8

Output time interv val (ns)

4.0

Typical-Typical

Linear region

100

150

200

250

300

350

0

50

0

80

160

240

320

400

Input time (ps)

480

Input time interval (ps)

Input and output of the amplifier for fastfast, slow-slow and typical-typical process corners

Standard deviation under the worst case process variations in the linear region.

Mar. 14, 2008

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