Mar 30, 2007 - profiling by secondary ion mass spectrometry (SIMS). Since the .... Fig 2. SIMS depth profile of Ta2O5/Ta for TaO (197) signal using(a) O2. + ion, (b) ..... 4) University of Bourgogne, Dijon, 1993 and 1995, as visiting scientist. 5).
12 th. ISMAS-WS-2007, March 25-30, 2007, Cidade de Goa, Dona Paula, Goa ... sharp interface between two media. By convention, the depth resolution ...
May 17, 2012 - Measuring roughness of buried interfaces by sputter depth profiling. S.V. Baryshev,1, â J.A. Klug,1 A.V. Zinovev,1 C.E. Tripa,1 J.W. Elam,2 and ...
c(4 x 4), (6 x 2), c(8 x 4) and (5 x 1) LEED patterns are observed increasing the Sn amount and after thermal treatment. A scanning tunneling micro- scopy (STM) ...
Three kinds of SiO2 films (HCl, dry and wet oxides) have been evaluated after graded ... formation of weak Si-H bonds at the SiO2/Si interface and .... (2) The Rms increased abruptly and the etching rate ... Strictly speaking, the difference in the d
Dec 20, 2013 - A. Rubano,1 C. Aruta,1 U. Scotti di Uccio,1 F. Miletto Granozio,1 L. Marrucci,1 T. Günter,2 T. Fink,2 .... Here, we recall the main points of a theory that has been ... impinging wave, β is the incidence angle respect to the surface ..
Naturally, h(x,y,t)h0 v0t, where h0 is the initial height of the interface and v0 is the speed of the surface while the solid is being eroded. A real surface is not ...
[2] J. Robertson, Journal of Vacuum Science & Technology B 18, 1785 (2000). ... [22] S. Brown, P. Thompson, M. Cooper, J. Kervin, D. Paul, W. Stirling, and A.
ion mass spectrometry (SIMS) differs significantly for impurity and ... is provided by the calibration mode using elemental Geâ and Siâ negative secondary ions.
nace code [13] used here. On the other hand, RBS using MeV ion beams does not have good mass resolution for these chal- cogenide compounds, and RBS ...
in a semi-infinite solid medium with continuously variable ... (a(w)>+=constant, one may write for the temperature field T(x), Eq. (3): e,(O) *'2. T(x) = T(O) e. (. 1. [C,$icX) - c ..... function of x, decreasing or increasing, numerical or in closed
Jun 16, 2006 - profiling of tritium in a graphite sample performed with our. AMS facility. Two tritium (T) depth distributions are shown. One depth distribution ...
Center, Durham, North Carolina 27710, USA. §Current affiliation: ... (50-940). 404. (118-834). 378. (50-940). Viral load (copies/ml; median). (range). 27900.
Jan 22, 2012 - burns/wound isolate PA14, and the poorly virulent, laboratory-associated strain PAO1. ...... NH and CHa performed phenotypic analyses.
Jan 22, 2012 - 1School of Molecular Bioscience, The University of Sydney, Sydney ...... Armstrong DS, Nixon GM, Carzino R, Bigham A, Carlin JB, Robins-.
Dec 20, 2013 - not limited to the LAO/STO interface: similar properties are reported for multiple ...... Nakagawa, H. Y. Hwang, and D. A. Muller, Nat. Mater. 5, 204 .... S. A. Seo, M. J. Han, G. W. J. Hassink, W. S. Choi, S. J. Moon,. J. S. Kim, T.
Dr. Oliver Benson. Eingereicht am ...... 15 (1969), 101â127. [71] W. G. Rothschild. ..... Oliver Benson danke ich für die spontane Bereitschaft, diese Arbeit zu ...
Studie s in Surface Science and Catalysis 132. Y. lwosawa, N. Oyam a ..... the basis of the mode-coupling theory by Meunier [l l] the ellipticity arising from the ..... S. Dietrich ... Zhang, S.M. Williams, Z. Huang, M.L. Schlossman, J Phys. Chem.
Nov 20, 2006 - trate that at and above the third layer of the films, the islands are anisotropic, ..... thicknesses possess a high degree of molecular orientation.
Sep 9, 2005 - R. Khasanov,1,2,3 D. G. Eshchenko,3,4 D. Di Castro,3,5 A. Shengelaya,3 F. La Mattina,3 A. Maisuradze,3 C. Baines,4. H. Luetkens,4 J.
area density was converted into a length scale, assuming the .... NA is. Avogadro's number. (6.022. 1023 atoms/mole). The first fraction of this formula is the.
Mar 1, 2013 ... Health Affairs is a multidisciplinary, peer-reviewed journal dedicated to the
serious exploration of domestic and international health policy ...
/Si interfaces, spherical-aberration correction, HRTEM, detection of .... 4 Through-focus series of a dry-oxidized SiO2/Si interface taken by the newly developed ...
4Hirox-USA Inc., 1060 Main St., River Edge, New Jersey 07661, USA. 5Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, California 94550, ...
