2013 Syllabus

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5) Analyze circuits which use diodes, BJTs, and FETs. (a,e,k) ... TEXT: Microelectronic Circuits, Sedra/Smith, 6th edition, Oxford University Press, 2010.
EGEE-3210 Electronics I FALL, 2013 Professor: Dr. Sam SanGregory Office: ENS-180C Hours: M-F 1:00-2:00 CATALOG DESCRIPTION: Introduction to the analysis of semiconductor electronic device theory and application, diodes, bipolar-junction transistors (BJTs), field-effect transistors (FETs), and the characteristics and application of operational amplifiers. Two lecture hours and one two-hour lab or recitation period per week. Prerequisite: EGEE-2010 Circuits. COURSE OBJECTIVES: 1) Understand the characteristics and applications of op-amps. (a) 2) Understand the physics of the PN junction. (a) 3) Understand the NPN and PNP junction transistors. (a) 4) Understand the operation and application of the Field Effect Transistor. (a) 5) Analyze circuits which use diodes, BJTs, and FETs. (a,e,k) 6) Require students to work in groups to perform laboratory experiments. (b,k) TEXT: Microelectronic Circuits, Sedra/Smith, 6th edition, Oxford University Press, 2010. HOMEWORK: Students will be given many opportunities to demonstrate their understanding of the material presented. All homework problems have been pre-selected (see daily course breakdown). All assigned problems will be collected on the TUESDAY after they are assigned at the beginning of the lecture period. Students may discuss approaches to problems with one another, however, each students work must be original. Students MAY NOT view or use homework solutions of other current or previous students, or solutions found on the internet or from solution manuals. Homework is designed to aid you in understanding the material and is required to be turned in when due. A good study habit is to attempt problems that have solutions in the back of the book before attempting the assigned problems. Late homework sets will not be accepted without prior approval. The Academic Integrity Pledge is a commitment to live with integrity in all areas of life including the classroom. All forms of academic dishonesty violate this pledge and could result in dismissal from this community. LABORATORY: This course includes an integral lab component which will meet once each week, however, some lab periods will be used for taking exams (see EXAMS below). Please refer to the EGEE-3210 LAB GUIDELINES for details concerning the laboratory portion of this course. School policy requires shoes (not sandals) to be worn in all laboratories. Each student must complete each lab exercise and receive an overall average of at least 70% in the laboratory in order receive a passing grade in this course. QUIZZES: Quizzes may occur any time during the semester. The quizzes will very closely resemble the assigned homework and may even be homework problems. Quizzes if given will count equal to one homework problem and will be averaged into the homework grade. Make-up quizzes will not be given. EXAMS: Course exams will be given approximately at the 1/4 points in the semester (see course outline). There will be three mid-term exams and one final exam. All mid-term exams will be given during laboratory sessions and will take place in a room to be announced. No exam will be made up without prior arrangement or a validated reason. You will be provided with a sheet of fundamental equations for the exams. Only scientific calculators may be used while taking the exams, palm, laptop, or cell-phone devices will not be permitted during the exam period. Preprogramming of calculators with equations, notes, or e-books is not allowed and will be considered cheating on exams. The final exam will be comprehensive.

Attendance: Daily class attendance is required and will be monitored. In accordance with the Engineering Department attendance policy, you are permitted 2 unexcused absences from class. If you accumulate more than 2 unexcused absences, your final course grade will be reduced one by letter. Note that an abundance of requests for missing classes may result in the denial of excusing absences. Out of respect for others in the class, cell phones, iPods and other communication devices should not be used during the lecture or laboratory periods. GRADING: The final course grade will be dependent on all of the measures mentioned above. The weighting for each measurement follows: Laboratories 16%, Homework/Quizzes 16%, Midterms (3) 16% each, and Final Exam 20%. Tentative Schedule Date

Reading

Topic

Homework

Thu, Aug 22

2.1-2.3

Ideal Operational Amplifiers

Tue, Aug 27

2.4-2.5

Amplifier Configurations

44, 94

Thu, Aug 29

2.4-2.5

Amplifier Configurations

37, 63

Tue, Sep 3

Non-ideal Operational Amplifier characteristics

Thu, Sep 5

3.1-3.6

PN Junction Physics

Tue, Sep 10

4.1-4.3

The PN-Junction Diode

Thu, Sep 12

4.4-4.6

Zener Diodes and Diode Circuits

Tue, Sep 17

4, 10, 12, 55

3, 19, 34, 41 59, 74, 85

Diode Wrap-up

Diodes EXAM 1

5.1-5.2

MOSFET Physics

Tue, Sep 24

5.3-5.4

MOSFET DC Operation and Amplifier Basics

55a, 65

Thu, Sep 26

5.5

Small Signal Operation and Models

76, 79

Tue, Oct 1

5.6-5.7

Amplifier Configurations and Biasing

80, 85, 98

Thu, Oct 3

5.8

Common Source Amplifier

86, 112abc

Tue, Oct 8

5.8

Common Gate Amplifier

Thu, Oct 10

5.8-5.9

Source Follower Amplifier and Other Factors

Tue, Oct 15

6.1-6.2

BJT Physics and Characteristics

10, 19, 26

93, 94 96 1, 7, 15, 29

MOSFET at DC MOSFET AMP MOSFET AMP EXAM 2

FALL BREAK

Tue, Oct 22

BJT DC Operation

32, 53, 59

Thu, Oct 24

6.4-6.5

BJT as an Amplifier and AC Models

76, 87, 95

Tue, Oct 29

6.6-6.7

BJT Amplifier Configurations and Biasing

Thu, Oct 31

6.8

Common Emitter Amplifier

142, 147

Tue, Nov 5

6.8

Common Base Amplifier

100, 151

Thu, Nov 7

6.8

Common Collector Amplifier

Tue, Nov 12

7.1-7.2

IC Amplifier Concepts

2, 10

Thu, Nov 14

7.3

Cascode Amplifiers

25, 42

Tue, Nov 19

7.4

IC Biasing

46, 58

Thu, Nov 21

7.5-7.6

Improved Current Mirrors and Transistor Pairs

Tue, Nov 26

8.1

MOS Differential Pair

Thu, Nov 28

Thanksgiving

130

125127

70, 81, 83 9

Tue, Dec 3

8.2

Small Signal MOS Differential Pair Operation

13, 17

Thu, Dec 5

8.3

BJT Differential Pair

33, 37

Tue, Dec 10

Operational Amplifiers

95, 107, 109

Thu, Sep 19

Thu, Oct 17

Lab

Final Exam 10:30 A.M.

BJT at DC BJT CE AMP BJT CC AMP BJT CB AMP

EXAM 3