Dynamic Simulation and Testing of the Electrode ... - IEEE Xplore
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Dynamic Simulation and Testing of the Electrode ... - IEEE Xplore
1Biomedical Engineering IDP and 2Electrical Engineering Dept., University of California, 420 Westwood Plaza,. Los Angeles, CA 90094, USA. 3Second Sight ...
Proceedings of the 2 nd International IEEE EMBS Conference on Neural Engineering Arlington, Virginia · March 16 - 19, 2005
Dynamic Simulation and Testing of the ElectrodeElectrolyte Interface of 3-D Stimulating Microelectrodes 1
Andy Hung1, David Zhou3, 4, Robert Greenberg3, and Jack W. Judy1,2
Biomedical Engineering IDP and 2Electrical Engineering Dept., University of California, 420 Westwood Plaza, Los Angeles, CA 90094, USA. 3Second Sight Medical Products, Inc., 12744 San Fernando Road Sylmar, CA 91342. 4 Materials Science and Engineering Dept., University of Southern California, 3651 Watt Way, Los Angeles, CA 90089 Abstract— Traditional simulations of current distribution for neuralelectrodes have been based on steady-state, resistive-only models that predict severe current crowding at sharp electrode topologies. In contrast, this work presents time-stepping calculations performed with SPICE and ANSYS that can accurately reflect the capacitive behavior of neuralelectrodes. The simulations display that at the electrode-electrolyte interface, the current distribution exhibits a variation of
