su m e t h at all d ela y e d ges in t h e d esign are e q ually su bj ect to v ariation , w e can ac h ie v e m a x im
Uncertainty-Aware Circuit Optimization Xiaoliang Bai University of California at San Diego La Jolla, CA 92037
Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598 ! " #
Philip N. Strenski IBM Thomas J. Watson Research Center Yorktown Heights, NY 10598 $ %& "! " #
David J. Hathaway IBM Microelectronics Essex Junction, VT 05452 & ! " #
ABSTRACT
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